JPH0467336B2 - - Google Patents
Info
- Publication number
- JPH0467336B2 JPH0467336B2 JP55084885A JP8488580A JPH0467336B2 JP H0467336 B2 JPH0467336 B2 JP H0467336B2 JP 55084885 A JP55084885 A JP 55084885A JP 8488580 A JP8488580 A JP 8488580A JP H0467336 B2 JPH0467336 B2 JP H0467336B2
- Authority
- JP
- Japan
- Prior art keywords
- crystal semiconductor
- single crystal
- semiconductor layer
- insulating film
- conductivity type
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6758—Thin-film transistors [TFT] characterised by the insulating substrates
- H10D30/6759—Silicon-on-sapphire [SOS] substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/611—Insulated-gate field-effect transistors [IGFET] having multiple independently-addressable gate electrodes influencing the same channel
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/637—Lateral IGFETs having no inversion channels, e.g. buried channel lateral IGFETs, normally-on lateral IGFETs or depletion-mode lateral IGFETs
Landscapes
- Recrystallisation Techniques (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8488580A JPS5710267A (en) | 1980-06-23 | 1980-06-23 | Semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8488580A JPS5710267A (en) | 1980-06-23 | 1980-06-23 | Semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5710267A JPS5710267A (en) | 1982-01-19 |
JPH0467336B2 true JPH0467336B2 (en]) | 1992-10-28 |
Family
ID=13843210
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8488580A Granted JPS5710267A (en) | 1980-06-23 | 1980-06-23 | Semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5710267A (en]) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58153850A (ja) * | 1982-03-08 | 1983-09-13 | 極東鋼弦コンクリ−ト振興株式会社 | リング状pc鋼材の緊張・定着用ブロツク |
US5753542A (en) * | 1985-08-02 | 1998-05-19 | Semiconductor Energy Laboratory Co., Ltd. | Method for crystallizing semiconductor material without exposing it to air |
US5962869A (en) * | 1988-09-28 | 1999-10-05 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor material and method for forming the same and thin film transistor |
US5264720A (en) * | 1989-09-22 | 1993-11-23 | Nippondenso Co., Ltd. | High withstanding voltage transistor |
JPH06151859A (ja) * | 1992-09-15 | 1994-05-31 | Canon Inc | 半導体装置 |
JP2891325B2 (ja) * | 1994-09-01 | 1999-05-17 | 日本電気株式会社 | Soi型半導体装置およびその製造方法 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5513947A (en) * | 1978-07-17 | 1980-01-31 | Seiko Epson Corp | Semiconductor integrated circuit device |
-
1980
- 1980-06-23 JP JP8488580A patent/JPS5710267A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5710267A (en) | 1982-01-19 |
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